Olympus MX50 reflected light microscope with bright and dark field POL and DIC
The Olympus MX50 wafer inspection microscope is a versatile and powerful reflected light microscope for the precise inspection of wafers in the semiconductor industry. It is equipped with bright and dark field illumination, POL (polarization microscopy) and DIC (differential interference contrast) as a contrast method.
The bright field illumination provides an excellent image of the wafer surface and enables the identification of faults, defects and impurities. Dark-field illumination, on the other hand, clearly highlights substructure surfaces and fine particles, making it easier to inspect structural defects.
With the DIC contrast method, the microscope can display transparent samples with a high level of detail, enabling the analysis of transparent layers on the wafers.
In addition, the Olympus MX50 wafer inspection microscope has a precise measuring probe under the stage, which enables exact positioning of the wafers. This feature ensures extremely accurate placement and alignment of the sample under the microscope, further optimizing inspection processes and increasing Efficiency.
The microscope has the following features:
- ergonomic trinocular phototube MX-SWETTR
- focusable WHN10X-H/22 eyepiece (goggles) and WHN10X/22 eyepiece (goggles)
- Analyzer U-AN and polarizer AX-PO
- DIC slider Nomarski prism U-DICR
- Electric 5-position nosepiece with the following objectives:
- MPlanFL N 5x/0.15 BD
- MPlanFL N 10x/0.30 BD
- LMPlanFL N 20x/0.40 BD
- LMPlanFL N 50x/0.50 BD
- large 32.5cm x 31.5cm X/Y cross table from Märzhäuser with coupling
- MX-LSH 12V 100W lamp
- Heidenhain touch probe MT12
- Heidenhain 3-axis digital readout
- Protective contamination shield MX-BSH
The microscope is in good used condition, the lenses look used on the outside, but give an excellent image.
The microscope will be shipped on a pallet with Schenker.
